发明名称 |
Refresh circuit having variable restore time according to operating mode of semiconductor memory device and refresh method of the same |
摘要 |
A refresh circuit having a variable restore time according to an operating mode of a semiconductor memory device and a refresh method of the same is provided. The refresh circuit includes a refresh pulse generating unit for receiving a clock signal to generate first and second refresh signals, a standby refresh signal generating unit for receiving the second refresh signal and a chip select signal to generate a standby refresh signal, the chip select signal representing an active state and a standby state of the semiconductor memory device, and a word-line pulse generating unit for receiving the first refresh signal and the standby refresh signal to generate a word-line driving signal. A pulse width of the word-line driving signal generated at the standby state is longer than that generated at the active state resulting in a sufficient refresh time at each memory cell.
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申请公布号 |
US2003198099(A1) |
申请公布日期 |
2003.10.23 |
申请号 |
US20030351008 |
申请日期 |
2003.01.24 |
申请人 |
SAMSUNG ELECTRONICS CO., INC. |
发明人 |
PARK JONG-YEOL |
分类号 |
G11C11/403;G11C11/406;G11C11/407;(IPC1-7):G11C7/00 |
主分类号 |
G11C11/403 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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