Semiconducting measurement device for measuring physical parameter has circuit for setting output characteristic of sensor element based on calibration data stored in auxiliary or main memory circuit

摘要

The device has a sensor element, output and data input connections, an earth connection, an operating voltage connection, an auxiliary memory circuit for storing calibration data, a re-writable read only main memory circuit, write connections, a mode selection circuit, a signal distinguishing device and a circuit for setting the sensor element output characteristic based on calibration data stored in the auxiliary or main memory circuit. The device has a sensor element (115), an output connection, a data input connection, an earth connection, an operating voltage connection, an auxiliary memory circuit (112) for storing calibration data, a re-writable read only main memory circuit (113), write connections, a mode selection circuit (111), a signal distinguishing device (117) and a setting up circuit (114) for setting the sensor element output characteristic based on calibration data stored in the auxiliary or main memory circuit.