发明名称 System for measuring phase error between two clocks by using a plurality of phase latches with different respective delays
摘要 A phase error measurement circuit for measuring phase error between two clocks on an integrated circuit is provided. The measurement circuit includes first and second clock signal inputs, a phase lead detector, a phase lag detector and a phase error measurement output. The phase lead detector includes a phase lead latch having a data input, which is coupled to the first clock signal input, a latch control input, which is coupled to the second clock signal input and a data output. The phase lag detector includes a phase lag latch having a data input, which is coupled to the second clock signal input, a latch control input, which is coupled to the first clock signal input and a data output. The phase error measurement output is formed by the data outputs of the phase lead latch and the phase lag latch.
申请公布号 US6636979(B1) 申请公布日期 2003.10.21
申请号 US20000548507 申请日期 2000.04.13
申请人 LSI LOGIC CORPORATION 发明人 REDDY DAYANAND K.;CHRISTIANSEN JOEL J.;FLANAGAN IAN MACPHERSON
分类号 H03L7/095;(IPC1-7):G06F11/00 主分类号 H03L7/095
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