发明名称 Dual double gate transistor and method for forming
摘要 The present invention provides a dual gate transistor and a method for forming the same that results in improved device performance and density. The present invention uses a double gate design to implement a dual gate transistor. A double gate is a gate which is formed on both sides of the transistor body. The present invention thus provides a transistor with two double gates in series that provide improved current control over traditional dual gate designs. The preferred embodiment of the present invention uses a fin type body with dual double-gates. In a fin type structure, the double gates are formed on each side of a thin fin shaped body, with the body being disposed horizontally between the gates.
申请公布号 US2003193065(A1) 申请公布日期 2003.10.16
申请号 US20020063323 申请日期 2002.04.11
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FRIED DAVID M.;NOWAK EDWARD J.
分类号 H01L21/336;H01L29/423;H01L29/786;(IPC1-7):H01L29/76;H01L29/94;H01L31/062 主分类号 H01L21/336
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