| 摘要 |
A test system (300) is configured to include a preconditioning integrated circuit (350) that is coupled between automatic test equipment (ATE) (310) and a device-under-test (DUT) (150). The preconditioning integrated circuit (350) is configured to precondition signals that are commmunicated to and from the device-under-test 8150), and particularly, to precondition high-frequency signals so as to avoid the adverse affects caused by long lead lines (311) between the automated test equipment (310) and the device-under-test (150). The preconditioning integrated circuit (350) is designed to provide direct contact with the device-under-test (310), thereby providing very short lead lines (351) to the device-under-test (150). High-frequency signals that are communicated to the device-under-test 8150) are generated, or reformed, at the preconditioning integrated circuit (350), based on control signals, or other test signals, from the automated test equipment (310). Highfrequency, or time-critical, signals that are received from the device-under-test (150) are processed and/or reformed by the preconditioning integrated circuit (350), for subsequent transmission to the automated test equipment (310). |
