发明名称 CONTACT TYPE PROBE
摘要 PROBLEM TO BE SOLVED: To provide a contact type probe capable of actively varying any force or contact force applied to the probe, removing vibration of mechanical resonance frequency generated by the probe weight and a spring for dead weight compensation under non-contact conditions, and reducing the probe weight as well as accurately detecting the initial position of the probe. SOLUTION: The contact type probe is equipped with an actuator allowing contact force for the probe to be generated or compensating the probe weight to generate certain contact force or certain force. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003294434(A) 申请公布日期 2003.10.15
申请号 JP20020095089 申请日期 2002.03.29
申请人 RICOH CO LTD 发明人 TAKAHASHI MINORU;ITO IZUMI
分类号 G01B5/00;G01B21/00;G01B21/20;(IPC1-7):G01B21/00 主分类号 G01B5/00
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