发明名称 Direct imaging process for forming resist pattern on a surface and use thereof in fabricating printing plates
摘要 A process is described for the direct production of an imaged pattern of resist on a substrate surface (such as a pattern of etch-resistant organic resin material on the surface of a copper-clad dielectric in connection with a printed circuit board (PCB) fabrication process or in the process of producing printed plates), which process utilizes thermo-resists rather than photoresists, i.e., compositions which undergo thermally-induced, rather than photo-induced, chemical transformations. A film of thermo-resist composition applied to the substrate surface is scanned by a focused heat source (e.g., a thermal laser emitting in the IR region) in a predetermined pattern, without a phototool, to bring about localized thermally-induced chemical transformations of the composition which either directly produce the resist pattern or produce in the film a developable latent image of the pattern.</PTEXT>
申请公布号 US6632588(B2) 申请公布日期 2003.10.14
申请号 US20020190873 申请日期 2002.07.08
申请人 GRUNWALD JOHN J.;HIRSH SHULAMIT;GAL CHAVA 发明人 GRUNWALD JOHN J.;HIRSH SHULAMIT;GAL CHAVA
分类号 B41C1/10;B41M5/36;G03F7/00;H05K3/00;H05K3/06;(IPC1-7):G03F7/00 主分类号 B41C1/10
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