RELAY SWITCHING INSPECTION SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide a relay switching inspection system capable of shortening time needed for testing even in case the number of relay circuits constituting a channel exchanger is increased. SOLUTION: A scanning signal generating circuit 40 in the relay switching inspection system 1000 generates a plurality of test signals for giving a plurality of input nodes. The plurality of test signals are pulse signals whose pulse periods do not overlap each other. A relay drive circuit 20 changes a connection state of the channel exchanger 100 as an object for inspection according to a given sequence. An anticipated value calculation unit 30 calculates an anticipated value outputted from the channel exchanger. A comparison circuit 50 outputs an inspection result by comparing an output from the channel exchanger 100 and the anticipated value. A buffer for testing 110 fixes a signal level given to the comparison circuit from the channel exchanger when a plurality of output nodes of the channel exchanger 100 are in an open state. COPYRIGHT: (C)2004,JPO