| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which can efficiently repair a plurality of defect words extending over to an adjacent address. SOLUTION: The address of a defect word is stored in an defect address storing means in advance. An address inputted to designate a memory word included in a memory is compared at actual use time with the address of the defect word stored in the defect address storing means by a comparator. When it is detected that the defect word is accessed, a plurality of memory words extending over the adjacent addresses and including this defect word are controlled to be replaced with repair words simultaneously by the replacement means. COPYRIGHT: (C)2004,JPO
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