发明名称 Method for forming barrier layer
摘要 The present invention relates to a method for forming a titanium/titanium nitride barrier layer applied in a contact/via opening with a high aspect ratio. After forming a titanium layer by ion metal plasma and before depositing a titanium nitride layer by using metal organic chemical vapor deposition, a gas-stable step is performed for adjusting pressure by supplying a hydrogen gas, a helium gas, a reactive source and a carrier gas. By using hydrogen gas in the gas-stable step before depositing the titanium nitride layer, the RC delay and reflection index of the resultant barrier layer are substantially reduced, thus increasing the performance of the contact/via plug and the device.
申请公布号 US2003190813(A1) 申请公布日期 2003.10.09
申请号 US20020115740 申请日期 2002.04.03
申请人 HUANG CHUN-CHIH;CHEN TAI-LANG 发明人 HUANG CHUN-CHIH;CHEN TAI-LANG
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/285
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