| 摘要 |
A system for detecting and analyzing polarized radiation incident with a skewed polarization plane while utilizing radiation filter structures having combined wavelength and polarization sensitive characteristics. The system includes first and second radiation filters each of which comprises a plurality of different wavelength lambda l to lambda n interference filter coatings applied to a filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths lambda l to lambda n are passed by the different stripes. Moreover, a plurality of different polarization filters of either parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arrangement includes first and second interference filter stripes for each wavelength lambda l to lambda n, a parallel polarization filter for each wavelength lambda l to lambda n, and a perpendicular polarization filter for each wavelength lambda l to lambda n, such that parallel and perpendicular polarization components are passed, and can be detected, for each wavelength lambda l to lambda n. A complete detection and analysis of the polarization characteristics of the radiation is achieved by orienting the first radiation filter with its parallel and perpendicular axes of polarization positioned at a 45 DEG acute angle relative to respectively the parallel and perpendicular axes of polarization of the second filter, such that radiation incident on the first and second radiation filters with a skewed polarization plane can be detected and analyzed with respect to its state of polarization.
|
