发明名称 |
Specific bonding analysis method and device therefor |
摘要 |
A specific bonding analysis method by which sensitivity and concentration range in analysis can be freely set, and a device using this are provided. The intended analysis is optimized by using a specific bonding analysis device capable of controlling the velocity of a sample passing through a detection part and causing no remaining of unnecessary components on a detection part.
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申请公布号 |
US2003190759(A1) |
申请公布日期 |
2003.10.09 |
申请号 |
US20030404563 |
申请日期 |
2003.04.02 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
KAWAMURA TATSUROU |
分类号 |
G01N33/543;G01N37/00;(IPC1-7):G01N33/558;G01N33/551 |
主分类号 |
G01N33/543 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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