发明名称 PROCEDE DE TEST D'UNE MEMOIRE DYNAMIQUE
摘要 A method for the testing of the retention time of a piece of information in a dynamic memory cell includes increasing the leakages of current in this cell to accelerate the loss of information. Under these testing conditions, a reduced retention time is controlled to approach the true retention time obtained under conditions of normal reading. This method makes it possible to reduce the time taken to test the retention time of the dynamic memories while at the same time being very reliable.
申请公布号 FR2772970(B1) 申请公布日期 2003.09.26
申请号 FR19970016466 申请日期 1997.12.24
申请人 SGS THOMSON MICROELECTRONICS SA 发明人 FOURNEL RICHARD
分类号 G11C29/50;(IPC1-7):G11C29/00;G11C11/401 主分类号 G11C29/50
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