发明名称 ION IMPLANTATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an ion implantation device capable of preventing insulation failure by restraining temperature drop of an arc chamber during halt of plasma. SOLUTION: This ion implantation device 100 is composed by structuring a mechanism from an ion source part 101 through a beam line part 102 to an end station part 103. The source part 101 is equipped with the arc chamber 11, a lead-out electrode 16 and a mass spectrograph 18. A filament 13 supported by insulators 12 is installed in the arc chamber 11. For instance, a heater 14 is installed as a heating mechanism surrounding the arc chamber 11. The heater 14 has a function for previously heating the insulators 12 and the arc chamber 11 in the halt of plasma of the arc chamber 11. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003272555(A) 申请公布日期 2003.09.26
申请号 JP20020071249 申请日期 2002.03.15
申请人 SEIKO EPSON CORP 发明人 KINUGAWA TAKUYA
分类号 H01J27/08;H01J37/08;H01J37/317;H01L21/265;(IPC1-7):H01J37/317 主分类号 H01J27/08
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