发明名称 Ag alloy film and sputtering-target for the Ag alloy film
摘要 A composition of an Ag alloy film as a thin film for electronic devices and target material to form thereof by a sputtering process are disclosed. The Ag alloy film consists of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 1.0 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities. The Ag alloy film may be used as a wiring film or a reflective film for flat panel display devices. The sputtering-target material for forming the Ag alloy film consists of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 1.0 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.
申请公布号 US2003180177(A1) 申请公布日期 2003.09.25
申请号 US20030393993 申请日期 2003.03.24
申请人 HITACHI METALS, LTD. 发明人 MURATA HIDEO
分类号 C22C5/00;C22C5/06;C23C14/14;C23C14/34;(IPC1-7):C22C5/00 主分类号 C22C5/00
代理机构 代理人
主权项
地址