发明名称 |
PHASE SHIFT MASK BLANK AND PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a high-quality phase shift mask blank and phase shift mask having the good intra-surface uniformity of the phase difference and transmittance rendered by a phase shift film and a method for manufacturing such phase shift mask blank and phase shift mask. <P>SOLUTION: The phase shift mask blank which is provided with at least one layer of the phase shift film on a substrate transparent to exposure light and in which the distribution of the phase difference in the phase shift film is within±1.5°and the distribution of the transmittance of the exposure is within±0.15% and the phase shift mask, and the method for manufacturing the phase shift mask blank and the phase shift mask. <P>COPYRIGHT: (C)2003,JPO</p> |
申请公布号 |
JP2003270772(A) |
申请公布日期 |
2003.09.25 |
申请号 |
JP20020075788 |
申请日期 |
2002.03.19 |
申请人 |
SHIN ETSU CHEM CO LTD |
发明人 |
INAZUKI SADAOMI;KANEKO HIDEO;TSUKAMOTO TETSUSHI;OKAZAKI SATOSHI |
分类号 |
C23C14/34;G03F1/32;G03F1/68;G03F1/80;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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