| 摘要 |
<p>Determining a measuring uncertainty and/or maximum measuring error of a polarization dependent loss PDL- tester (1) for determining a PDL value of a device under test DUT is provided by using the PDL tester (1) for determining a value of PDL of a verification element (6) having an actual value of PDL greater than a maximum value of a specified measuring range, wherein the PDL tester (1) has an expected measuring uncertainty and/or expected maximum measuring error. The measuring uncertainty and/or maximum measuring error of the tester (1) is then derived from the determined value of DPL of the verification element (6) in conjunction with the actual value of PDL of the verification element (6).</p> |
