发明名称 DEVICE AND METHOD FOR MEASURING THICKNESS
摘要 PROBLEM TO BE SOLVED: To provide a thickness measuring device, capable of more accurately measuring the thickness of a measurement object. SOLUTION: Ultrasonic waves are transmitted to the measurement object, and the thickness of the measurement object is measured from the reflected wave. When the measurement object is a human body, the approximate thickness of the measurement object is estimated according to the information on the measurement object such as information on the height, information on percent of body fat, information on the peripheral diameter of a region as a measurement object, and information for specifying a region as a measurement object. According to the estimated approximate thickness, power of ultrasonic wave to be transmitted is controlled to correct measurement of thickness. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003265472(A) 申请公布日期 2003.09.24
申请号 JP20020073180 申请日期 2002.03.15
申请人 OMRON CORP 发明人 KOBAYASHI TATSUYA;YAMAUCHI TAKANOBU;YAMADA SATOSHI
分类号 G01B17/02;A61B8/00;(IPC1-7):A61B8/00 主分类号 G01B17/02
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