发明名称 |
Method of testing serial interface |
摘要 |
A method of testing a circuit having an interface which includes data and clock information where phase jitter is introduced into the clock that produces the clock information. The clock is cycled by increasing the period of the clock for a predetermined number of clock cycles so as to introduce an increasing phase shift advance in the clock. The clock is also cycled by decreasing the period of the clock for a predetermined number of clock cycles so as to introduce an increasing phase shift delay in the clock. The circuit under test is caused to sample the data using a clock derived from the clock information. The sampled data is then compared with reference data to determine the error rate.
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申请公布号 |
US6625560(B1) |
申请公布日期 |
2003.09.23 |
申请号 |
US20010904783 |
申请日期 |
2001.07.13 |
申请人 |
SILICON IMAGE, INC. |
发明人 |
MOLLA ZIAUS S.;DACOSTA VICTOR;HWANG SEUNG HO;SUNG BAEGIN |
分类号 |
G01R31/317;G01R31/319;G01R31/3193;(IPC1-7):G06F11/00 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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