发明名称 STRAIN MEASURING INSTRUMENT, STRAIN SUPPRESSING DEVICE, EXPOSURE SYSTEM, AND METHOD OF MANUFACTURING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To accurately measure strains generated in an object and significantly reduce the strains. <P>SOLUTION: In a moving stage system 803, strains generated in the surface 800 of a moving stage is controlled so as to suppress the strains by using a strain measuring instrument 801 which measures the strains generated in the surface 800 and a strain suppressing device 802 which controls the strains. The strain measuring instrument 801 and strain suppressing device 802 are not bonded directly to the surface 800 of the moving stage. In addition, the instrument 801 measures the strains generated in the surface 800 in one direction only. Moreover, the device 802 is attached to the surface 800 of the moving stage so that forces transmitted to the moving stage may become one-directional components. Consequently, the strains generated in the surface 800 of the moving stage can be suppressed significantly by accurately measuring the strains. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003262501(A) 申请公布日期 2003.09.19
申请号 JP20020062303 申请日期 2002.03.07
申请人 CANON INC 发明人 ISOBE YASUSHI;ITO HIROHITO;TSUI KOTARO
分类号 G01B7/16;G03F7/20;H01L21/027;H01L21/68;H01L41/08;(IPC1-7):G01B7/16 主分类号 G01B7/16
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