Methods and apparatus for measuring change in performance of ring oscillator circuit

摘要

An integrated circuit device is provided having one or more pairs of ring oscillator circuits. Each ring oscillator circuit of the one or more pairs of ring oscillator circuits is configured to connect to at least one voltage source capable of applying a stress to a ring oscillator circuit. One or more frequency measurement circuits are each electrically connected to a respective pair of the one or more pairs of ring oscillator circuits. Each frequency measurement circuit is configured to measure a stress induced change in frequency difference of the respective pair of the one or more pairs of ring oscillator circuits.