发明名称 |
Method for fabricating capacitor device |
摘要 |
After forming a lower electrode by patterning a conducting film formed on a substrate by using an etching gas including chlorine, chlorine remaining on the lower electrode is removed by irradiating the lower electrode with plasma of a gas including fluorine. Thereafter, a capacitor dielectric film made of an insulating metal oxide is formed on the lower electrode, and an upper electrode is formed on the capacitor dielectric film.
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申请公布号 |
US2003175998(A1) |
申请公布日期 |
2003.09.18 |
申请号 |
US20020322526 |
申请日期 |
2002.12.19 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
NAGANO YOSHIHISA;HAYASHI SHINICHIRO;JUDAI YUJI |
分类号 |
H01L21/3065;H01L21/00;H01L21/02;H01L21/3213;H01L21/8242;H01L21/8246;H01L27/105;(IPC1-7):H01L21/00;H01L21/824 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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