发明名称 Method for fabricating capacitor device
摘要 After forming a lower electrode by patterning a conducting film formed on a substrate by using an etching gas including chlorine, chlorine remaining on the lower electrode is removed by irradiating the lower electrode with plasma of a gas including fluorine. Thereafter, a capacitor dielectric film made of an insulating metal oxide is formed on the lower electrode, and an upper electrode is formed on the capacitor dielectric film.
申请公布号 US2003175998(A1) 申请公布日期 2003.09.18
申请号 US20020322526 申请日期 2002.12.19
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NAGANO YOSHIHISA;HAYASHI SHINICHIRO;JUDAI YUJI
分类号 H01L21/3065;H01L21/00;H01L21/02;H01L21/3213;H01L21/8242;H01L21/8246;H01L27/105;(IPC1-7):H01L21/00;H01L21/824 主分类号 H01L21/3065
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