发明名称 METHOD FOR PRODUCING SILICON WAFER AND SILICON WAFER
摘要 Silicon wafer W is thermal-annealed in atmosphere G to form new vacancies therein in a thermal annealing step and atmosphere G in the thermal annealing step contains a nitride gas having a lower decomposition temperature than a decomposable temperature of N2 so that the thermal annealing is carried out at a lower temperature or for a short time to suppress generation of slip and to provide satisfactory surface roughness. <IMAGE>
申请公布号 EP1345262(A1) 申请公布日期 2003.09.17
申请号 EP20010998993 申请日期 2001.11.28
申请人 SUMITOMO MITSUBISHI SILICON CORPORATION 发明人 NAKADA, YOSHINOBU;SHIRAKI, HIROYUKI
分类号 H01L21/322;H01L21/324 主分类号 H01L21/322
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