发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device capable of decreasing the number of manufacturing steps of a triple well including a plurality of ion implantation steps and a heat treatment step. SOLUTION: The method for manufacturing a semiconductor device comprises (a) a step for forming a first mask layer 12 having a first opening 14 on a semiconductor substrate 10, (b) a step for forming a first insulation layer 16 on an exposed surface of a semiconductor substrate 10 at the first opening, (c) a step for forming an impurity layer by introducing a second conductivity type first impurity into the semiconductor substrate through the first insulation layer 16, (d) a step for forming a first well 24 by heat treatment and forming a second insulation layer 22 on the exposed surface of the semiconductor substrate at the first opening, (e) a step for forming a second mask layer 26 having a second opening 28 on the first mask layer, and (f) a step for introducing a first conductivity type second impurity 32 into the semiconductor substrate through the second insulation layer to form a second well in the first well 24. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003257883(A) 申请公布日期 2003.09.12
申请号 JP20020060489 申请日期 2002.03.06
申请人 SEIKO EPSON CORP 发明人 HAYASHI MASAHIRO
分类号 H01L21/265;H01L21/266;H01L21/316;H01L21/324;H01L21/8234;(IPC1-7):H01L21/265 主分类号 H01L21/265
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