发明名称 Atomically testing and setting or clearing one or more bits stored in a memory location
摘要 Logic for or atomically testing and setting one or more bits stored in a memory location, in a single operation, disables one or more interrupts, access a number stored in a memory location, copies the number from the memory location to a working register, tests a particular bit of the number copied from the memory location, sets or clears a bit flag to reflect the state of the particular bit copied from the memory location for access in one or more subsequent operations, sets the particular bit of the number copied from the memory location, and copies the number from the working register to the memory location. Logic for atomically testing and clearing one or more bits stored in a memory location, in a single operation, disables one or more interrupts, accesses a number stored in a memory location, copies the number from the memory location to a working register, tests a particular bit of the number copied from the memory location, sets or clears a bit flag to reflect the state of the particular bit copied from the memory location for access in one or more subsequent operations, clears the particular bit of the number copied from the memory location, and copies the number from the working register to the memory location.
申请公布号 US2003172238(A1) 申请公布日期 2003.09.11
申请号 US20030349467 申请日期 2003.01.22
申请人 TESSAROLO ALEXANDER;PRESKITT RANDALL 发明人 TESSAROLO ALEXANDER;PRESKITT RANDALL
分类号 G06F9/30;G06F9/308;G06F9/312;G06F9/32;G06F9/46;G06F9/52;(IPC1-7):G06F12/00 主分类号 G06F9/30
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