发明名称 |
Automatic humidity step control thermal analysis apparatus |
摘要 |
An automatic humidity step control thermal analysis apparatus has a detector for detecting and measuring a physical property of a sample and for generating a physical property signal corresponding to the physical property of the sample. The sample is housed in a sample chamber which is capable of controlling the temperature and humidity of the sample. A water chamber generates water vapor at a preselected temperature and is capable of controlling the temperature of water in the water chamber in a stepwise manner. A heat insulating pipe directs water vapor from the water chamber to the sample chamber and includes a heater for preventing dew condensation. A signal stability determination circuit receives a physical property signal from the detector and generates a trigger signal when a rate of change of the physical property signal drops below a preselected reference value. A control device controls the temperature of water in the water chamber in a stepwise manner in accordance with the trigger signal generated by the signal stability determination circuit to thereby adjust the humidity of the sample chamber in a stepwise manner.
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申请公布号 |
US6616330(B2) |
申请公布日期 |
2003.09.09 |
申请号 |
US20010001335 |
申请日期 |
2001.10.26 |
申请人 |
SEIKO INSTRUMENTS INC.;CHUGAI SEIYAKU KABUSHIKI KAISHA |
发明人 |
NAKAMURA NOBUTAKA;NAKAMURA TOSHIHIKO;TAKATA NORIYUKI |
分类号 |
G01N25/00;G01N5/04;G01N25/20;G01N25/48;G01N35/00;(IPC1-7):G01N25/00;G01N25/56 |
主分类号 |
G01N25/00 |
代理机构 |
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代理人 |
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主权项 |
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