发明名称 |
FAULT DETECTION METHOD AND APPARATUS USING MULTIPLE DIMENSION MEASUREMENTS |
摘要 |
A method for identifying faults includes processing a plurality of manufacturedd items (210) in a process flow (10); measuring a first dimension of a feature (300, 360) formed on the manufactured items (210) at a first position; measuring at least a second dimension of the feature (300, 360) at a second position proximate the first position; calculating a dimension metric based on the first and second measured dimensions; and comparing dimension metrics for a set of the manufactured items (210) to identify a drift condition. A manufacturing system includes a plurality of tools (30-80, 220) for processing manufactured items (210) to identify a drift condition. A manufacturing system includes a plurality of tools (30-80, 220) for processing manufactured items (210) in a process flow (10), a metrology tool (220), and a fault monitor (130). The metrology tool (220) is adapted to measure a first dimension of a feature (300, 360) formed on the manufactured items (210) at a first position and measure at least a second dimension of a feature (300, 360) formed on the manufactured items (210) at a first position and measure at least a second dimension of the feature (300, 360) at a second position proximate the first position. The fault monitor (130) is adapted to calculate a dimension metric based on the first and second measured dimension and compare dimension metrics for a set of the manufactured items (210) to identify a drift condition. |
申请公布号 |
WO0227782(A3) |
申请公布日期 |
2003.09.04 |
申请号 |
WO2001US24685 |
申请日期 |
2001.08.07 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
MARKLE, RICHARD, J.;PURDY, MATTHEW, A.;JENKINS, NAOMI, M. |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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