发明名称 Nonvolatile semiconductor memory cell and method for fabricating the memory cell
摘要 A nonvolatile semiconductor memory cell includes a transistor component formed on a substrate and a storage node that determines the switching state of the transistor component. The storage node is arranged near a control gate electrode. The storage node has a group of vertically oriented column structures having at least two semiconductor layer zones and an insulating layer zone situated between the two semiconductor layer zones.
申请公布号 US6614069(B2) 申请公布日期 2003.09.02
申请号 US20020054440 申请日期 2002.01.22
申请人 INFINEON TECHNOLOGIES AG 发明人 ROESNER WOLFGANG;SCHULZ THOMAS;RISCH LOTHAR;RAMCKE TIES
分类号 H01L21/28;H01L29/788;(IPC1-7):H01L29/788 主分类号 H01L21/28
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