发明名称 STENCIL MASK AND MANUFACTURING METHOD THEREFOR
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a stencil mask of high precision and long life, together with its manufacturing method, where no warp occurs under radiation of an electron beam. <P>SOLUTION: A stencil mask 10 for electron beam comprises a plurality of drawing openings 24 formed after a conductive film 20 is formed on a silicon film 18 of an SOI wafer 12. The plurality drawing openings 24 are formed at the conductive film 20 while the openings similar in shape but larger than the plurality of drawing openings 24 are formed on the silicon film 18. A silicon layer 14 and a silicon oxide film 16 of the SOI wafer 12 in a drawing region are removed in sash form. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003243296(A) 申请公布日期 2003.08.29
申请号 JP20020043658 申请日期 2002.02.20
申请人 RIIPURU:KK 发明人 NOZUE HIROSHI
分类号 G03F1/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/20
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