发明名称 METHOD AND SYSTEM FOR NITRIDING SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To form an SiN film on a silicon wafer of large area without causing any damage on the silicon wafer through a simple arrangement using a convenient method. SOLUTION: The system 21 for nitriding a silicon wafer comprises a processing container 24 for containing the silicon wafer 22 in the inner space 23, a means 25 for supplying NH<SB>3</SB>gas to the inner space 23, a means 27 for heating the silicon wafer 22, and a means 28 for irradiating UV-rays toward the inner space 23. In the nitriding system 21, NH<SB>3</SB>gas is dissociated with the exciting energy of the UV-rays and caused to react on the silicon wafer 22 thus forming an SiN film usable as an insulation film on the surface of the silicon wafer 22. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003243387(A) 申请公布日期 2003.08.29
申请号 JP20020043772 申请日期 2002.02.20
申请人 KANSAI TLO KK 发明人 YOSHIMOTO MASAHIRO;TAGUCHI KOJI;TANADA YUSUKE
分类号 H01L21/318;(IPC1-7):H01L21/318 主分类号 H01L21/318
代理机构 代理人
主权项
地址