发明名称 |
METHOD OF FORMING A FULLY-DEPLETED SOI (SILICON-ON-INSULATOR) MOSFET HAVING A THINNED CHANNEL REGION |
摘要 |
A sub-0.05 mum channel length fully-depleted SOI MOSFET device having low source and drain resistance and minimal overlap capacitance and a method of fabricating the same are provided. The sub-0.05 mum channel length fully-depleted SOI MOSFET device includes an SOI structure which contains at least an SOI layer having a channel region of a first thickness and abutting source/drain regions of a second thickness present therein, wherein the second thickness is greater than the first thickness and the source/drain regions having a salicide layer present thereon. A gate region is present also atop the SOI layer.
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申请公布号 |
US2003162358(A1) |
申请公布日期 |
2003.08.28 |
申请号 |
US20020084550 |
申请日期 |
2002.02.26 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HANAFI HUSSEIN I.;BOYD DIANE C.;CHAN KEVIN K.;NATZLE WESLEY;SHI LEATHEN |
分类号 |
H01L21/336;H01L29/786;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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