发明名称 METHOD OF FORMING A FULLY-DEPLETED SOI (SILICON-ON-INSULATOR) MOSFET HAVING A THINNED CHANNEL REGION
摘要 A sub-0.05 mum channel length fully-depleted SOI MOSFET device having low source and drain resistance and minimal overlap capacitance and a method of fabricating the same are provided. The sub-0.05 mum channel length fully-depleted SOI MOSFET device includes an SOI structure which contains at least an SOI layer having a channel region of a first thickness and abutting source/drain regions of a second thickness present therein, wherein the second thickness is greater than the first thickness and the source/drain regions having a salicide layer present thereon. A gate region is present also atop the SOI layer.
申请公布号 US2003162358(A1) 申请公布日期 2003.08.28
申请号 US20020084550 申请日期 2002.02.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HANAFI HUSSEIN I.;BOYD DIANE C.;CHAN KEVIN K.;NATZLE WESLEY;SHI LEATHEN
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/336
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