发明名称 METHOD AND APPARATUS FOR MEASURING INTERFERENCE, MANUFACTURING METHOD FOR OPTICAL SYSTEM, AND PROJECTION ALIGNER
摘要 PROBLEM TO BE SOLVED: To surely improve S/N of the data acquire by a fringe scan method, independent of fluctuation of environment. SOLUTION: In an interference measurement method, a fringe scan which changes optical path difference between reference light and the light to be detected is performed by a plurality of times. The data for change in interference fringe pattern that occurs at each fringe scan is sampled. A plurality of sampled data are averaged to reduce a random noise. Here, phase deviation between the plurality of data is suppressed before the average. So, the S/N of the data after averaging is surely improved independent of fluctuation of environment. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003240508(A) 申请公布日期 2003.08.27
申请号 JP20020041441 申请日期 2002.02.19
申请人 NIKON CORP 发明人 NAKAMURA KEN
分类号 G01B9/02;H01L21/027;(IPC1-7):G01B9/02 主分类号 G01B9/02
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