发明名称 |
Method for uniform nitridization of ultra-thin silicon dioxide layers in transistor gates |
摘要 |
A method of forming an ultra-thin dielectric layer, including the steps of: providing a substrate having a semiconductor surface; forming an oxygen-containing layer on the semiconductor surface; exposing the oxygen-containing layer to a nitrogen-containing plasma to create a uniform nitrogen distribution throughout the oxygen-containing layer; and re-oxidizing and annealing the layer to stabilize the nitrogen distribution, heal plasma-induced damage, and reduce interfacial defect density.
|
申请公布号 |
US6610614(B2) |
申请公布日期 |
2003.08.26 |
申请号 |
US20010885695 |
申请日期 |
2001.06.20 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
NIIMI HIROAKI;HATTANGADY SUNIL;KHAMANKAR RAJESH |
分类号 |
H01L21/28;H01L21/314;H01L29/51;(IPC1-7):H07L21/469 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|