发明名称 Semiconductor device with stress relieving layer comprising circuit board and electronic instrument
摘要 A semiconductor device with a package size close to its chip size is, apart from a stress absorbing layer, such as to effectively absorb thermal stresses. A semiconductor device (150) has a semiconductor chip provided with electrodes (158), a resin layer (152) forming a stress relieving layer provided on the semiconductor chip, wiring (154) formed from the electrodes (158) to over the resin layer (152), and solder balls (157) formed on the wiring (154) over the resin layer (152); the resin layer (152) is formed so as to have a depression (152a) in the surface, and the wiring (154) is formed so as to pass over the depression (152a).
申请公布号 US6608389(B1) 申请公布日期 2003.08.19
申请号 US20000666406 申请日期 2000.09.20
申请人 SEIKO EPSON CORPORATION 发明人 HASHIMOTO NOBUAKI
分类号 H01L21/60;H01L21/768;H01L23/31;H01L23/36;H01L23/485;H01L23/532;(IPC1-7):H01L23/48 主分类号 H01L21/60
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