发明名称 Apparatus and method for automatically verifying a designed circuit
摘要 This invention provides an apparatus and a method for automatically verifying a designed semiconductor integrated circuit (LSI). The apparatus verifies a circuit generated by a generator for generating a circuit diagram of the whole LSI in accordance with the arrangement of basic cells which define a predetermined circuit unit. At least one of basic cells includes a verification symbol specifying a name and verification contents of a node to be verified. The apparatus analyzes a circuit diagram of the whole LSI generated in accordance with the arrangement having a cell including verification symbols to extract names and verification contents of the nodes to be verified, generates a verification pattern in accordance with the extracted node name and verification contents, executes a circuit simulation by using the verification pattern, analyzes the simulation result, and determines whether a the verified node is accepted or rejected.
申请公布号 US6609231(B2) 申请公布日期 2003.08.19
申请号 US20010984154 申请日期 2001.10.29
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ODA TAKAHIRO
分类号 G01R31/28;G01R31/317;G06F17/50;(IPC1-7):G06F17/50 主分类号 G01R31/28
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