发明名称 Method of manufacturing Q-value and device therefor
摘要 A method of measuring a Q-value according to a mean value and standard deviation of a signal level distribution of input data comprises: a first step for calculating a difference between bit error rates of input data sampled by a plurality of threshold values which are a little different from each other; a second step for calculating a difference between the difference data obtained in the first step; and a third step (steps 118 and 120) for calculating a mean value and standard deviation of the signal level of input data when data obtained in the first and the second step (steps 100 to 116) are utilized.
申请公布号 US6609220(B2) 申请公布日期 2003.08.19
申请号 US20020274137 申请日期 2002.10.21
申请人 ANDO ELECTRIC CO., LTD. 发明人 KAJI MASANORI
分类号 H04L1/20;(IPC1-7):G06F11/00 主分类号 H04L1/20
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