发明名称 QUANTUM WELL STRUCTURE, SEMICONDUCTOR ELEMENT EMPLOYING IT AND ITS FABRICATING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor element exhibiting excellent emission efficiency by eliminating the effect of piezoelectric field sufficiently while sustaining good crystallinity of an active layer. <P>SOLUTION: A quantum well active layer has a multilayer structure of a barrier layer undoped region (In<SB>0.02</SB>Ga<SB>0.98</SB>N layer 702), a well layer (undoped In<SB>0.2</SB>Ga<SB>0.8</SB>N layer 703) and a barrier layer n-type region (n-type In<SB>0.02</SB>Ga<SB>0.98</SB>N layer 701), formed sequentially. Concentration of Si is set not higher than 5&times;10<SP>18</SP>cm<SP>-3</SP>in the barrier layer n-type region. <P>COPYRIGHT: (C)2003,JPO
申请公布号 JP2003229645(A) 申请公布日期 2003.08.15
申请号 JP20020024685 申请日期 2002.01.31
申请人 NEC CORP 发明人 KAZETAGAWA MUNEYUKI
分类号 H01L21/205;H01L33/06;H01L33/16;H01L33/32;H01L33/36;H01S5/02;H01S5/22;H01S5/30;H01S5/323;H01S5/34;H01S5/343 主分类号 H01L21/205
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