发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a means for preventing destruction of a current sense element by an excess voltage, the current sense element being incorporated in an insulation gate type transistor to prevent an excess current. SOLUTION: In a semiconductor device provided with a first IGBT 1 controlling a main current and a second IGBT 2 preventing the excess current of a first IGBT 1, a first diode 9 and a second diode 10 are inversely connected in series between a first emitter 5 and a second emitter 6 so as to be parallel to a sense resistor 8. In this case, a breakdown voltage to the opposite direction voltage of both diodes 9 and 10 is set to a value lower than a breakdown voltage between both emitters 5 and 6 and higher than the upper limit value of a sense voltage, and thus, the destruction of the second IGBT 2 by the excess voltage is surely prevented while effectively preventing the excess current at the first IGBT 1. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003229572(A) 申请公布日期 2003.08.15
申请号 JP20020028300 申请日期 2002.02.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 TOMOMATSU YOSHIFUMI
分类号 H01L29/78;H01L27/04;H01L27/06;H01L29/739;(IPC1-7):H01L29/78 主分类号 H01L29/78
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