| 发明名称 |
Method for determining the reflectance profile of materials |
| 摘要 |
The present invention relates to a method for determining the reflectance profile of materials and more particularly, the present invention relates to a method for calculating specular and diffuse reflectance and hence, the emittance of materials at ambient temperatures.
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| 申请公布号 |
US2003151747(A1) |
申请公布日期 |
2003.08.14 |
| 申请号 |
US20030341595 |
申请日期 |
2003.01.14 |
| 申请人 |
COUNCIL OF SCIENTIFIC AND INDUSTRIAL RESEARCH |
发明人 |
NAGARAJAN RAMAKRISHNAN;VARMA SATHYA PRAKASH;GUPTA DEVINDER |
| 分类号 |
G01N21/55;(IPC1-7):G01N21/47 |
主分类号 |
G01N21/55 |
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