JITTER TOLERANCE DIAGNOSING METHOD, AND JITTER TOLERANCE DIAGNOSING DEVICE

摘要

A jitter tolerance diagnosing method comprising instructing a jitter adding circuit arranged at the preceding stage of a desired circuit block to generate a jitter of a desired magnitude, monitoring at least one output signal outputted from an LSI to be evaluated, and judging whether or not the characteristics of the output signal conforms to a desired standard, to measure a jitter tolerance. A jitter tolerance diagnosing device to which the method is applied is also disclosed. The jitter tolerance on the whole LSI to be evaluated and a desired circuit block in the LSI can be measured by preparing a simple interface.