发明名称 METHOD FOR CONTINUOUS CONTROL OF THICKNESS OF LAYERS OF BIMETAL WITH FERROMAGNETIC BASE
摘要 FIELD: monitoring and measuring technique, possibly continuous thickness measuring of layers of sheet and coiled bimetal of electrically conductive and ferromagnetic materials. SUBSTANCE: method comprises steps of acting upon bimetal by means of magnetic field excited by inductor with =-shaped magnetic circuit; placing inductor with gap at side of ferromagnetic layer; arranging screening measuring coil over inductor at opposite side of bimetal; arranging second reference inductor and second screening reference coil similarly relative to gage; connecting screening measuring coil and reference coil, secondary windings of inductors respectively in series and mutually opposite; determining fluctuation of thickness of bimetal layers according to change of voltages of screening measuring coil and secondary winding of inductor relative to voltages of screening reference coil and secondary winding of reference inductor. EFFECT: enhanced accuracy of measuring thickness of bimetal layers at rolling process, enlarged functional possibilities and enlarged using range. 1 dwg
申请公布号 RU2210058(C1) 申请公布日期 2003.08.10
申请号 RU20020102151 申请日期 2002.01.23
申请人 OAO "ZAVOD PODSHIPNIKOV SKOL'ZHENIJA" 发明人 PLUZHNIKOV JU.V.;KOLMAKOV A.V.;PUDOVKIN A.P.;CHERNYSHOV V.N.
分类号 G01B7/06;G01N27/90 主分类号 G01B7/06
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