发明名称 BS CLUSTER TEST DIAGNOSIS RATE IMPROVING SYSTEM
摘要 PROBLEM TO BE SOLVED: To solve a problem of a PT board design wherein the diagnostic rate of a test for the PT board using BS function is set to become a prescribed value or more so as to reduce a test cost and improve the quality of shipping products; however, the diagnostic rate in the PT board test using the BS function and calculated by a manual selection result of the cluster requires a lot of manhour. SOLUTION: This BS cluster test diagnosis rate improving system is provided with a means for setting a set of simple net states differentiated for cluster identification such as test signal impression, power impression, clock impression, constant voltage impression, and instable states in each net for determining whether or not a test signal is propagated, determining a combination of the net states in an input side in each circuit, changing the net in an output side to the test signal impression state, when the test signal can be propagated, selecting the net system whose net state from a BS driving point to a BS observing point becomes the test signal impression state, and calculating the diagnostic rate along with the selected whole cluster. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003223474(A) 申请公布日期 2003.08.08
申请号 JP20020021242 申请日期 2002.01.30
申请人 PFU LTD 发明人 OSHIMA JUNICHI;MUROTANI TADAHIRO
分类号 G01R31/28;G06F17/50;(IPC1-7):G06F17/50 主分类号 G01R31/28
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