发明名称 SCR devices in silicon-on-insulator CMOS process for on-chip ESD protection
摘要 A silicon-on-isolator CMOS integrated circuit device includes a semiconductor substrate, an isolation layer formed over the semiconductor substrate, an n-type MOS transistor having a gate, a drain region, and a source region formed over the isolation layer, and a p-type MOS transistor having a gate, a drain region, and a source region formed over the isolation layer and contiguous with the n-type MOS transistor, wherein the n-type MOS transistor and the p-type MOS transistor form a silicon controlled rectifier to provide electrostatic discharge protection.
申请公布号 US2003146474(A1) 申请公布日期 2003.08.07
申请号 US20020062714 申请日期 2002.02.05
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 KER MING-DOU;HUNG KEI-KANG;CHANG CHYH-YIH
分类号 H01L27/02;H01L27/12;(IPC1-7):H01L27/01;H01L31/039 主分类号 H01L27/02
代理机构 代理人
主权项
地址