METHOD FOR DETECTING DEFECT IN INFRARED THERMAL OBSERVATION DEVICE

摘要

PURPOSE: A method for detecting a defect generated from an infrared thermal observation device is provided to improve performance of the infrared thermal observation device by improving quality of an image generated from an infrared detector. CONSTITUTION: A digital image signal is inputted from a high temperature image and a low temperature image(S400). A gain value and a deviation value with respect to pixels are calculated by using the high temperature image and the low temperature image(S405). Then, a first mean gain value and a mean deviation value are calculated based on the gain value and the deviation value with respect to pixels(S410). Defects of each pixel are determined by using the first mean gain value and the mean deviation value(S420). Defects of each pixel determined if a temperature of the high temperature image is lower than a predetermined value, or a difference between the gain value and the first mean gain value is obviated from a predetermined limit value, or a difference between the deviation value and mean deviation value is obviated from a predetermined limit value.