发明名称 |
Method for forming a cavity in a monocrystalline silicon substrate and semiconductor device with a cavity in a monocrystalline silicon substrate with an epitaxial cover layer |
摘要 |
<p>A semiconductor component having a cavity is produced by: (i) forming a cavity in a monocrystalline silicon substrate (1), and covering walls of the cavity with a cover layer at least in an upper end region of the cavity; (ii) depositing a covering layer on the silicon substrate with a selective epitaxial process; and (iiii) growing the covering layer only on the silicon surface. Production of a semiconductor component having a cavity comprises: (a) providing a monocrystalline silicon substrate having a silicon surface; (b) forming a cavity in the silicon substrate and covering walls of the cavity, with a cover layer at least in an upper end region of the cavity; (c) depositing a covering layer on the silicon substrate with a selective epitaxial process; and (d) growing the covering layer only on the silicon surface to cover the cavity with the covering layer, and to form a covered cavity in the monocrystalline silicon substrate.</p> |
申请公布号 |
EP1333472(A2) |
申请公布日期 |
2003.08.06 |
申请号 |
EP20030000289 |
申请日期 |
2003.01.09 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
POPP, MARTIN;TEMMLER, DIETMAR;SCHUPKE, KRISTIN;SCHILLING, UWE;POMPLUN, KERSTIN |
分类号 |
H01L21/20;H01L21/8242;H01L27/108;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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