发明名称 AN IN-CHIP MONITORING SYSTEM TO MONITOR INPUT/OUTPUT OF FUNCTIONAL BLOCKS
摘要 <p>An in-chip monitoring method and apparatus are disclosed. In one embodiment the apparatus includes a test pad (201) a transmission gate (203) and a plurality of test components (207, 209, 211)coupled to the transmission gate. The transmission gate is attached to a substrate and adapted to receive a code word uniquely addressed to one of the plurality of test components. In a further embodiment, the transmission gate is further adapted to relay an output of the one of the plurality of test components to the test pad, in response to receipt of the code word.</p>
申请公布号 WO2003062845(A2) 申请公布日期 2003.07.31
申请号 US2003001115 申请日期 2003.01.14
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