发明名称 ALIGNMENT INSPECTION DEVICE FOR OBJECT BODY OF ION IMPLANTATION SYSTEM, AND ITS METHOD
摘要 PROBLEM TO BE SOLVED: To provide an object body alignment inspection device of an ion implantation system for aligning and disposing an object body, by inspecting whether inclination and a rotation angle of an object body are in the range of a set value for preventing channeling phenomenon, wherein impurity ion to be implanted to an object body is implanted to a set depth or more, and its method. SOLUTION: An object body alignment inspection device 10a has a body 12, which forms an object body shape in ion implantation process and has calibration displaying an angle from the center of an object body in an edge part, a center shaft 14 set to project from a center of the body 12 and a designating part which is set to rotate based on the center shaft 14 and designates the angle of calibration, in a direction wherein a load functions from the center of the central shaft 14. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003218051(A) 申请公布日期 2003.07.31
申请号 JP20020300561 申请日期 2002.10.15
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 NAM SEUNG-MAN
分类号 H01J37/317;H01L21/00;H01L21/265;H01L21/68;(IPC1-7):H01L21/265 主分类号 H01J37/317
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