发明名称 DAMASCENE COPPER ELECTROPLATING PROCESS WITH LOW-PRESSURE PRE-PROCESSING
摘要 A damascene copper electroplating process with low-pressure pre-processing for fabricating interconnect structures on wafers comprising the following steps: a. closing two control valves to stop circulation of a plating solution; b. conveying a wafer to be plated on a predetermined location in a hallow container; c. venting the hallow container until the pressure inside the hallow container reaching a pre-determined low pressure and then dipping the wafer into the plating solution; d. introducing external air until the pressure inside the hallow container reaching standard value; e. opening the two control valves to re-circulate the plating solution; f. repeating steps a to e for next wafer. The new process can reduce void defects and gap defects on wafers.
申请公布号 US2003143842(A1) 申请公布日期 2003.07.31
申请号 US20020057960 申请日期 2002.01.29
申请人 YEH TSUNG-KUANG 发明人 YEH TSUNG-KUANG
分类号 C25D5/00;C25D7/12;H01L21/288;H01L21/768;(IPC1-7):H01L21/44;C22F1/08 主分类号 C25D5/00
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