PRÜFUNG DER OSI-SCHICHTEN UNTER UNIX,申请号DE1997615831T-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	PRÜFUNG DER OSI-SCHICHTEN UNTER UNIX
摘要
申请公布号	DE69715831(T2)	申请公布日期	2003.07.31
申请号	DE1997615831T	申请日期	1997.03.21
申请人	ERICSSON INC., RESEARCH TRIANGLE PARK;TEKELEC CORP., CALABASAS	发明人	GESSEL, J.;AUTREY, KEVIN;SWETMAN, C.;BAKER, JAY
分类号	G06F11/22;G06F13/00;H04L12/26;H04L29/06;H04L29/14;H04M3/00;H04Q3/545;H04Q11/04;(IPC1-7):H04L12/26	主分类号	G06F11/22
代理机构		代理人
主权项
地址

您可能感兴趣的专利

CONTROLLER OF ROBOT

MANUFACTURE OF LARGE-SIZED WELDED STRUCTURE

METHOD FOR FORMING METAL HAVING INTERNAL CAVITY OF SUCH SHAPE THAT DROPS ARE GATHERED

SETTING DEVICE OF PREPROGRAMMING SIGNAL

AC GENERATOR UTILIZING ROTARY CURRENT

LINEAR PULSE MOTOR AND ITS USING METHOD

RESISTANCE ELEMENT FOR ELECTRONIC DEVICE AND MANUFACTURE THEREOF

FORMING METHOD OF THIN-FILM METAL INSULATOR SEMICONDUCTOR TRANSISTOR

DEFLECTION YOKE

HEAD RETURN DEVICE OF SOUND RECORDING AND REPRODUCING DEVICE

GENERATING CIRCUIT OF POSITION SIGNAL

SEMICONDUCTOR SUBSTRATE

MAGNETIC DISK DEVICE

OPTICAL TRACK TRACKING DEVICE

IMAGE BEARING MEMBER

ELECTROPHOTOGRAPHIC SENSITIVE BODY

SINGLE MAGNETIC POLE TYPE VERTICAL MAGNETIC HEAD

IMAGE RECORDING DEVICE

METHOD OF MONITORING SIZE FOR SEMICONDUCTOR FABRICATION

OIL-ABSORBING MATERIAL