| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an array tester capable of enhancing the test accuracy. <P>SOLUTION: A stage 33 with an array substrate 22 installed on an installation surface 32 thereof is moved by a stage motivity system 34. Needle probes 42 of a relaying printed circuit board 39 are electrically connected to drive terminals 25 of display domain parts 23 of the array substrate 22. Driving characteristics of a device under test (DUT) of the domain parts 23 of the array substrate 22 are electrically tested with an array tester body 47. An insulating substrate for noise cutting is disposed between a needle frame 38 positioned higher than the stage 33 and the circuit board 39. This makes it possible to reduce electrical noise components coming from the array substrate 22 toward the DUT and coming from the motivity system 34 to the circuit board 39. The test accuracy is enhanced when the driving characteristics of the DUT in the domain part 23 of the array substrate 22 are electrically tested by the tester body 47. <P>COPYRIGHT: (C)2003,JPO</p> |
